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Message ID: 653     Entry time: Thu Jun 27 19:00:36 2019
Author: Eric Dufresne 
Type: 8-ID-E 
Category: Optics 
Subject: Reflectivity curves of Si 220 and 111 in 8-ID-E 

Someone asked me a question about polarization yesterday so as I was updating the
calculations for longitudinal coherence for Si 220, I decided to included in the elog.

Please note the P polarization for both 8-ID-E and I monochromators now.
Monochromator type        Reflectivity         FWHM of reflectivity (microrad)    dE/E = FWHM/tg(\thetaB)        l_l = \lambda/(dE/E) (microns)

Si (111)                    96.4 %                 24.8                              1.36E-4                        0.83 
Si (220)                    89.7 %                 19.4                              3.96E-5                        4.3 


This is a dispersive geometry.
I reported also some calculations from 8-ID-I earlier:
https://8id.xray.aps.anl.gov/elog/8-ID/514

ED




Date: Fri, 28 Jun 2019 00:29:56 +0000
From: Eric Dufresne <[email protected]>
To: "8ID beamline staff -- Jiang, Zhang" <[email protected]>,
"Strzalka, Joseph W." <[email protected]>,
Qingteng Zhang <[email protected]>
Cc: Suresh Narayanan <[email protected]>
Subject: NX question answered!


A student asked me a question about X-ray polarization. Here are details on
the 8-ID-D mono for your reference. Note the longitudinal coherence,
bandwidth and reflectivity. https://8id.xray.aps.anl.gov/elog/8-ID/653

Joe, you did quite well on the 2016 upgrade! More flux through higher
reflectivity, and wider bandpass (x3.4), but you loose on brightness some.

I am happy too with higher longitudinal coherence, and with 2D focusing I
think I am doing better too with flux because there is less strain on my
crystal.

Cheers,

Eric
Attachment 1: Si220-Ppolarized.png  10 kB  | Hide | Hide all
Si220-Ppolarized.png
Attachment 2: Si111-Ppolarized.png  11 kB  | Hide | Hide all
Si111-Ppolarized.png
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